Roughness

Fast non-contact surface roughness measurement
according to DIN & ISO standards.

Analyze every detail

From wafers to piston rings and pacemakers, precision is essential in every detail. Our high-precision measurement systems provide fast, non-destructive roughness analysis of rough or smooth object surfaces.

ROUGHNESS

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Roughness Analysis

2D-Roughness (R-Parameter)

With our profilometers you can determine roughness in seconds in 2D, whether you’re interested in average roughness (Ra), roughness depth (Rz), or total profile height. Our manual software ScanCT allows you to do this with just a few clicks. Alternatively, you can automate and speed up your measurements with ASCAN.

3D-Roughness (S-Parameter)

3D roughness measurement captures the entire surface structure, offering a more comprehensive view than 2D profile measurements. Our software makes analyzing S-parameters, such as mean arithmetic height (Sa) or maximum height (Sz), fast and easy. Simply select the area and analysis type, and results are calculated instantly. Options like S- or L-filters can be adjusted with just a few clicks.

R-Parameter on an area

In addition to the acquisition of R-parameters via individual profiles, you also have the option of determining the maximum, minimum, mean or median values of all profiles over a 3D surface. This enables a comprehensive analysis of the R-parameters over the entire examined area and offers a holistic perspective on the surface structure.

Stilus tip simulation

The results of the optical roughness measurement can be compared directly with the results of traditional tactile measurement methods using the stylus tip simulation. This enables a consistent evaluation and interpretation of the surface structure regardless of the measurement method used.

Automate your Roughness measurements with ASCAN

Explore AScan

Do you have question about your Roughness measurements?

Non-Contact Measurement

For roughness values below Ra 0.25 we provide systems with white light interferometers for highly accurate roughness measurements and a z-resolution down to 0.1 nanometer. For expected values above our systems can be used with chromatic confocal sensors for high-speed measurements also on larger areas.

Chromatic Confocal

For roughness measurements as fine as Ra 0.25 and above chromatic confocal sensors offer the perfect balance of high-speed and accuracy across nearly all surfaces and materials

3D White Light Interferometer

For smooth surfaces, our White Light Interferometer delivers Z-resolution as fine as 0.1 nm, enabling precise roughness measurements on polished wafers, mirrors, and other extremely smooth materials.

Examples

With our wide range of sensor technologies, roughness can be accurately measured on nearly any material.

Wafer

Tiny scratches, minute defects or holes – we offer metrology systems for roughness measurements also on polished wafers with a z-resolution down to 0.1 nanometer and a lateral resolution in sub-micron.

Glass

A white light interferometer (WLI) sensor is used to measure very smooth surfaces. This method is ideal for materials such as glass or mirrors.

Gold Surface

With up to 1.15 million data points per second, chromatic confocal white light sensors are ideal for 3D roughness measurements on larger surfaces. Additionally, they offer a resolution of up to 3 nm.