VANTAGE 1
High-Resolution 2D Profilometer
Measurement and Analysis Modes
Manual / Semi-Automated
Measurement Length
50 mm
Use-Case Examples
Roughness, thick film and step height measurements on substrates, pads, PCBs
Measure with Ease
The VANTAGE 1 is a 2D Profilometer for high-resolution measurement on a length up of 50 mm. Easy to handle and fast to measure to get high-accurate results in no time.
Technology
The VANTAGE 1 offers an innovative, compact design that seamlessly integrates all electronics and sensors into one sleek housing. This intelligent integration minimizes the system’s footprint, freeing up valuable workspace and offering great flexibility in use.
The system features a 45 mm z-axis to adjust for different samples heights. The optional automated Z-axis provides autofocus functionality and includes a range extender to measure heights beyond the sensor’s standard measurement range.
The VANTAGE 1 is equipped with an automatic scan axis featuring 50-nanometer encoders for highly precise scans over lengths of up to 50 mm. Measure surfaces with exceptional accuracy, achieving lateral measurement point spacing down to one micrometer.
Focus on what matters. The system features a built-in camera with multiple magnification options, allowing you to easily navigate on your samples or choose the sensor’s scanning area in live view. Additionally, the camera enables quick and automated fiducial alignment.
Available Sensors
Achieve flexible measurements with the compact chromatic confocal point sensors, featuring interchangeable sensor heads and a resolution down to 8 nm.
Control the thickness of transparent and infrared-transparent materials (e.g. silicon, glass) with a resolution as fine as 1 nm.
Interested in a configuration of the VANTAGE 1?
Sophisticated Software
Application Examples
The VANTAGE 1 offers extensive 2D analysis capabilities, from measuring heights, flatness and thickness to evaluating roughness. It’s your versatile partner for 2D metrology needs.
Roughness
Heights
Thickness
Options
Customize the VANTAGE 1 to fit your exact needs with a range of versatile upgrade options.
Granite Base
Enhance the VANTAGE 1 with a durable granite base for a secure setup and smooth, stable sample placement.
Calibration Targets​
Calibrate and certify the system anytime with ease. A wide selection of calibration targets and built-in automated procedures make the process fast and easy.
VANTAGE 1 Mounting Brackets
Elevate the entire VANTAGE 1 system above your samples with the flexible brackets, providing maximum flexibility to easily position and scan even larger parts underneath.
Discuss your metrology needs and applications to find the ideal configuration for you.​​
General
cyberTECHNOLOGIES GmbH
Georg-Kollmannsberger-Straße 3
85386 Eching-Dietersheim
Germany