Resolution: down to 1 nm
Speed: up to 70,000 datapoints /sec
Optional Feature: Internal Reference to switch between thickness and height mode
Sensor Controller | Wavelength | Smallest thickness in air | Largest thickness in air | Frequency | Axial resolution |
---|---|---|---|---|---|
IT 400 | 1310 | 29 µm | 3200 µm | 70 kHz | 1 nm |
IT 500 | 1310 | 38 µm | 4300 µm | 70 kHz | 1 nm |
IT RW 500 | 1550 | 44 µm | 4900 µm | 70 kHz | 1.5 nm |
IT 1000 | 1310 | 66 µm | 7500 µm | 70 kHz | 2 nm |
IT 1300 | 1310 | 87 µm | 10500 µm | 70 kHz | 3 nm |
IT 1700 | 1310 | 114 µm | 12600 µm | 70 kHz | 4 nm |
IT RW 1000 | 1550 | 57 µm | 6400 µm | 70 kHz | 2 nm |
IT DW 250 | 1020 | 15 µm | 1800 µm | 70 kHz | 1 nm |
IT DW 500 | 1070 | 29 µm | 3100 µm | 70 kHz | 1 nm |
IT DW 1000 | 1120 | 66 µm | 7500 µm | 70 kHz | 2 nm |
IT HDW 250 | 1020 | 15 µm | 1800 µm | 4 kHz | 1 nm |
IT HDW 500 | 1070 | 29 µm | 3100 µm | 4 kHz | 1 nm |
IT HTW | 900 – 1200 (Halogen) | 4 µm | 300 µm | 4 kHz | 1 nm |
IT LR | 880 | 16 µm | 2600 µm | 66 kHz | 1 nm |
Sensor Head | Measuring Head 1a | Measuring head 1b | Measuring head 2 LWD | |||||||
---|---|---|---|---|---|---|---|---|---|---|
Sensor Controller | IT HTW | IT LR | IT | IT RW | IT (H)DW | IT | IT RW | IT (H)DW | IT HTW | IT LR |
Working distance
 [mm] | 40 mm | 40 mm | 100 mm | |||||||
Lateral resolution [µm] | 30 µm | 3 µm | 5,5 µm | 6,2 µm | 3,7 µm | 14 mm | 16 µm | 9,3 µm | 75 µm | 7,5 µm |
Numerical aperture | 0.1 (90° +/- 5°) | 0.1 (90° +/- 5°) | 0.045 (90° +/- 2°) |
Have complete control over the sensor through our software. Choose from preset materials and dispersion curves, add new ones. Switch between sensor types to automatically move the selected sensor to the defined position – and much more. Our software is designed for effortless use of all our sensor technologies within a single system.
This advanced measurement technology offers precise distance measurements using a polychromatic light source.
A Fourier Transform of the pattern reveals the optical length, and dividing it by the refractive index gives the thickness.
This technology outperforms conventional laser-based triangulation methods, offering greater reliability across various environments.
With a resolution down to 0.1 nanometer, this sensor is perfect for measuring the smallest step heights or surface roughness on smooth surfaces like mirrors.
A versatile all-rounder with resolution down to 3 nanometers - also available in models capable of capturing up to 36 million data points per second.
cyberTECHNOLOGIES GmbH
Georg-Kollmannsberger-Straße 3
85386 Eching-Dietersheim
Germany
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